Klar, Bernhard Goodness-of-fit tests for discrete models based on the integrated distribution function. (English) Zbl 1093.62533 Metrika 49, No. 1, 53-69 (1999). Summary: This paper presents a new widely applicable omnibus test for discrete distributions which is based on the difference between the integrated distribution function \(\Psi(t)=\int_t^\infty (1-F(x))\,dx\) and its empirical counterpart. A bootstrap version of the test for common lattice models has accurate error rates even for small samples and exhibits high power with respect to competitive procedures over a large range of alternatives. Cited in 1 ReviewCited in 18 Documents MSC: 62G10 Nonparametric hypothesis testing PDFBibTeX XMLCite \textit{B. Klar}, Metrika 49, No. 1, 53--69 (1999; Zbl 1093.62533) Full Text: DOI