
02369982
j
2006e.03273
Ismail, Ali A.
Optimum constantstress partially accelerated life test plans with typeII censoring. The case of Weibull failure distribution.
InterStat, No. 7, 14 p. (2006).
2006
,
EN
K95
K75
reliability
partially accelerated life tests
Weibull distribution
constantstress
maximum likelihood estimation
Fisher information matrix
generalized asymptotic variance
optimum test plans
failurecensoring
Monte Carlo simulation
This paper deals with simple constantstress Partially Accelerated Life Tests (PALT) with TypeII censoring. It is assumed that the lifetime at design stress has a Weibull distribution. Statistically optimal PALT plans are developed such that the Generalized Asymptotic Variance (GAV) of the MaximumLikelihood Estimators (MLEs) of the model parameters at design stress is minimized. For illustration, simulation studies are introduced. (orig.)