id: 02369982
dt: j
an: 2006e.03273
au: Ismail, Ali A.
ti: Optimum constant-stress partially accelerated life test plans with type-II
censoring. The case of Weibull failure distribution.
so: InterStat, No. 7, 14 p. (2006).
py: 2006
pu: ,
la: EN
cc: K95 K75
ut: reliability; partially accelerated life tests; Weibull distribution;
constant-stress; maximum likelihood estimation; Fisher information
matrix; generalized asymptotic variance; optimum test plans;
failure-censoring; Monte Carlo simulation
ci:
li:
ab: This paper deals with simple constant-stress Partially Accelerated Life
Tests (PALT) with Type-II censoring. It is assumed that the lifetime at
design stress has a Weibull distribution. Statistically optimal PALT
plans are developed such that the Generalized Asymptotic Variance (GAV)
of the Maximum-Likelihood Estimators (MLEs) of the model parameters at
design stress is minimized. For illustration, simulation studies are
introduced. (orig.)
rv: