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Zbl 1159.62011
Bhattacharya, Sabyasachi; Basu, Ayanendranath; Bandyopadhyay, Subhadip
Goodness-of-fit testing for exponential polynomial growth curves. (English)
[J] Commun. Stat., Theory Methods 38, No. 3, 340-363 (2009). ISSN 0361-0926; ISSN 1532-415X/e

Summary: A goodness-of-fit test is proposed for the family of exponential polynomial growth curve models [EPGCM; {\it M. Heinen}, Netherlands J. Agricult. Sci. 47, 67--89 (1999)], which has wide applications in different areas of science. The exponential growth curve model (EGCM), the most prominent member of the EPGCM family, is a simple and biologically meaningful growth model. Other members of the EPGCM family also cover many realistic growth processes. Thus, a goodness-of-fit test for the EPGCM class has substantial practical value. The goodness-of-fit test developed here is based on the properties of finite differences. The performance of the theory developed is illustrated through simulation and analysis of real data.

MSC 2000:: *62F03 Parametric hypothesis testing
62F05 Asymptotic properties of parametric tests
62P10 Appl. of statistics to biology

Keywords: exponential model; exponential polynomial family

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