Advanced Search

Query:

Fill in the form and click »Search«...

Format:

Display: entries per page entries

Zbl 1213.68555
Yang, Jianwei; Chen, Zirun; Chen, Wen-Sheng; Chen, Yunjie
Robust affine invariant descriptors. (English)
[J] Math. Probl. Eng. 2011, Article ID 185303, 15 p. (2011). ISSN 1024-123X; ISSN 1563-5147/e

Summary: An approach is developed for the extraction of affine invariant descriptors by cutting object into slices. Gray values associated with every pixel in each slice are summed up to construct affine invariant descriptors. As a result, these descriptors are very robust to additive noise. In order to establish slices of correspondence between an object and its affine transformed version, general contour (GC) of the object is constructed by performing projection along lines with different polar angles. Consequently, affine in-variant division curves are derived. A slice is formed by points fall in the region enclosed by two adjacent division curves. To test and evaluate the proposed method, several experiments have been conducted. Experimental results show that the proposed method is very robust to noise.

MSC 2000:: *68T10 Pattern recognition

Comment on this Item PDF MathML XML ASCII DVI PS BibTeX Online Ordering Article Article Journal Journal

	Scientific prize winners of the ICM 2010
	Overhang
	Lie groups, physics and geometry. An introduction for physicists, engineers and chemists.

Advanced Search

Zentralblatt MATH Berlin [Germany]