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Zbl 0981.68745
Kirschner, Holger; Hillebrand, Reinald
Neural networks for HREM image analysis. (English)
[J] Inf. Sci. 129, No.1-4, 31-44 (2000). ISSN 0020-0255

Summary: We present a new neural network-based method of image processing for determining the local composition and thickness of III--V semiconductors in high resolution electron microscope images. This is of great practical interest as these parameters influence the electrical properties of the semiconductor. Neural networks suppress correlated noise from amorphous object covering and distinguish between variations of sample thickness and semiconductor composition.
MSC 2000:
*68U99 Computing methodologies
68U10 Image processing

Keywords: neural network-based method; image processing

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