Advanced Search

Query:

Fill in the form and click »Search«...

Format:

Display: entries per page entries

Zbl 0771.62072
Tang, S.M.; MacNeill, I.B.
The effect of serial correlation on tests for parameter change at unknown time. (English)
[J] Ann. Stat. 21, No.1, 552-575 (1993). ISSN 0090-5364

Summary: It is shown that serial correlation can produce striking effects in distributions of change-point statistics. Failure to account for these effects is shown to invalidate change-point tests, either through increases in the type 1 error rates if low frequency spectral mass predominates in the spectrum of the noise process, or through diminution of the power of tests when high frequency mass predominates. These effects are characterized by the expression $\bigl\{2\pi f(0)/\int\sp \pi\sb{-\pi} f(\lambda)d\lambda\bigr\}$, where $f(\cdot)$ is the spectral density of the noise process; in sample survey work this is known as the design effect or ``deff''.\par Simple precise adjustments to change-point test statistics which account for serial correlation are provided. The same adjustment applies to all commonly used regression models. Residual processes are derived for both stationary time series satisfying a moment condition and for general linear regression models with stationary error structure.

MSC 2000:: *62M10 Time series, etc. (statistics)
62E20 Asymptotic distribution theory in statistics
62G10 Nonparametric hypothesis testing
62J05 Linear regression
62M15 Spectral analysis of processes

Keywords: cumulative sums; residuals processes; partial sums; deff; serial correlation; distributions of change-point statistics; type 1 error rates; low frequency spectral mass; high frequency mass; spectral density; noise process; design effect; adjustments to change-point test statistics; regression models; stationary time series; general linear regression models; stationary error structure

Comment on this Item PDF MathML XML ASCII DVI PS BibTeX Online Ordering Article Journal Journal

	Scientific prize winners of the ICM 2010
	Overhang
	Lie groups, physics and geometry. An introduction for physicists, engineers and chemists.

Advanced Search

Zentralblatt MATH Berlin [Germany]