Krishnan Iyer, R.; Downs, T. A moment approach to evaluation and optimization of complex system reliability. (English) Zbl 0381.62079 IEEE Trans. Reliab. 27, 226-229 (1978). Page: −5 −4 −3 −2 −1 ±0 +1 +2 +3 +4 +5 Show Scanned Page Cited in 1 Document MSC: 62N05 Reliability and life testing PDFBibTeX XMLCite \textit{R. Krishnan Iyer} and \textit{T. Downs}, IEEE Trans. Reliab. 27, 226--229 (1978; Zbl 0381.62079) Full Text: DOI