Nelson, Wayne; Kielpinski, Thomas J. Theory for optimum censored accelerated life tests for normal and lognormal life distributions. (English) Zbl 0318.62081 Technometrics 18, 105-114 (1976). Page: −5 −4 −3 −2 −1 ±0 +1 +2 +3 +4 +5 Show Scanned Page Cited in 21 Documents MSC: 62N05 Reliability and life testing 62F10 Point estimation PDFBibTeX XMLCite \textit{W. Nelson} and \textit{T. J. Kielpinski}, Technometrics 18, 105--114 (1976; Zbl 0318.62081) Full Text: DOI