io-port.net - Advanced Search

Advanced query form:

Year:

Type:

Journal

Book

Article

Please fill in your query. A complete syntax description you will find on the General Help page.

first | previous | 1 | next | last

Result 1 to 2 from 2 total

io-port 50234662 Trapes, C.; Goguenheim, D.; Bravaix, A.

Experimental extraction of degradation parameters after constant voltage stress and substrate hot electron injection on ultrathin oxides (English)

Microelectronics Reliability 45, No. 5-6, 883-886 (2005).

PDF XML AMS-TeX TEXT BIBTeX DOI

io-port 50233925 Bravaix, A.; Trapes, C.; Goguenheim, D.; Revil, N.; Vincent, E.

Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide CMOS technologies (English)

Microelectronics Reliability 43, No. 8, 1241-1246 (2003).

PDF XML AMS-TeX TEXT BIBTeX DOI

first | previous | 1 | next | last

Result 1 to 2 from 2 total