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Result 1 to 6 from 6 total

io-port 50219549 Sayil, Selahattin; Kerns, David V.; Kerns, Sherra E.

Comparison of contactless measurement and testing techniques to a all-silicon optical test and characterization method (English)

IEEE T. Instrumentation and Measurement 54, No. 5, 2082-2089 (2005).

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io-port 70116827 Kerns, David V.; Kerns, Sherra E.; Pratt, Gill A.; Somerville, Mark H.; Crisman, Jill D.

The search for design in electrical engineering education (English)

DELTA, 192-196 (2002).

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io-port 70059516 Kerns, Daniel R.; Eggers, Susan J.

Balanced scheduling: instruction scheduling when memory latency is uncertain (with retrospective) (English)

Best of PLDI, 515-527 (1993).

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io-port 70059676 Kerns, Daniel R.; Eggers, Susan J.

Balanced scheduling: instruction scheduling when memory latency is uncertain (English)

PLDI, 278-289 (1993).

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io-port 71000004 Kirch, David B.; Kerns, Douglas; Fleischer, Kurt W.; Barr, Alan H.

Analog VLSI implementation of gradient descent (English)

NIPS, 789-796 (1992).

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io-port 04047613 Tung, Leonard J.; Kerns, David V.

An algorithm to generate complete test sets for stuck-at faults in combinational logic circuits. (English)

J. Franklin Inst. 325, No. 1, 133-142 (1988).

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