Result 1 to 20 from 27 total
Analytical approach to single memristor circuits (English)
ECCTD, 94-97 (2011).
1
io-port 50113288 Miyake, Masataka;
Hori, Daisuke;
Sadachika, Norio;
Feldmann, Uwe;
Miura-Mattausch, Mitiko;
Mattausch, Hans Jürgen;
Ohguro, Tatsuya;
Iizuka, Takahiro;
Taguchi, Masahiko;
Miyamoto, Shunsuke
Degraded frequency-tuning range and oscillation amplitude of LC-vcos due to the nonquasi-static effect in MOS varactors (English)
IEICE Transactions 92-C, No. 6, 777-784 (2009).
2
io-port 50121682 Miyake, Masataka;
Hori, Daisuke;
Sadachika, Norio;
Feldmann, Uwe;
Miura-Mattausch, Mitiko;
Mattausch, Hans Jürgen;
Iizuka, Takahiro;
Matsuzawa, Kazuya;
Sahara, Yasuyuki;
Hoshida, Teruhiko;
Tsukada, Toshiro
Non-quasi-static carrier dynamics of mosfets under low-voltage operation (English)
IEICE Transactions 92-C, No. 5, 608-615 (2009).
3
Circuit simulation for nanoelectronics. (English)
Breitner, Michael H. (ed.) et al., From nano to space. Applied mathematics inspired by Roland Bulirsch. Berlin: Springer (ISBN 978-3-540-74237-1/hbk). 11-26 (2008).
4
Rladybug - an R package for stochastic epidemic models (English)
Computational Statistics & Data Analysis 52, No. 2, 680-686 (2007).
5
Modeling and simulation for thermal-electric coupling in an SOI-circuit. (English)
Anile, Angelo Marcello (ed.) et al., Scientific computing in electrical engineering. Proceedings of the 5th international conference on scientific computing in electrical engineering (SCEE), Capo D’Orlando, Sicily, Italy, September 5‒9, 2004. Berlin: Springer (ISBN 3-540-32861-0/hbk). Mathematics in Industry 9, 27-32 (2006).
6
Modelling and discretization of circuit problems. (English)
Schilders, W. H. A. (ed.) et al., Handbook of numerical analysis. Vol XIII. Special volume: Numerical methods in electromagnetics. Amsterdam: Elsevier/North Holland (ISBN 0-444-51375-2/hbk). Handbook of Numerical Analysis 13, 523-629 (2005).
7
Predictability improvement as an asymmetrical measure of interdependence in bivariate time series. (English)
Int. J. Bifurcation Chaos Appl. Sci. Eng. 14, No. 2, 505-514 (2004).
8
Predictability improvement as an asymmetrical measure of interdependence in bivariate time series (English)
I. J. Bifurcation and Chaos 14, No. 2, 505-514 (2004).
9
Actual problems of circuit simulation in industry. (English)
Antreich, K. (ed.) et al., Modeling, simulation, and optimization of integrated circuits. Proceedings of a conference, Oberwolfach, Germany, November 25‒December 1, 2001. Basel: Birkhäuser (ISBN 3-7643-2192-X/hbk). ISNM, Int. Ser. Numer. Math. 146, 83-99 (2003).
10
CHORAL ‒ a charge-oriented algorithm for the numerical integration of electrical circuits. (English)
Jäger, Willi (ed.) et al., Mathematics ‒ key technology for the future. Joint projects between universities and industry. Berlin: Springer (ISBN 3-540-44220-0/hbk). 429-438 (2003).
11
Finding beneficial DAE structures in circuit simulation. (English)
Jäger, Willi (ed.) et al., Mathematics ‒ key technology for the future. Joint projects between universities and industry. Berlin: Springer (ISBN 3-540-44220-0/hbk). 413-428 (2003).
12
CHORAL ‒ a one step method as numerical low pass filter in electrical network analysis. (English)
Van Rienen, Ursula (ed.) et al., Scientific computing in electrical engineering. Proceedings of the 3rd international workshop, Warnemünde, Germany, August 20-23, 2000. Berlin: Springer. Lect. Notes Comput. Sci. Eng. 18, 199-215 (2001).
13
CAD-based electric-circuit modeling in industry. II: Impact of circuit configurations and parameters. (English)
Surv. Math. Ind. 8, No.2, 131-157 (1999).
14
CAD-based electric-circuit modeling in industry. I: Mathematical structure and index of network equations. (English)
Surv. Math. Ind. 8, No.2, 97-129 (1999).
15
Concurrent technology, device, and circuit development for eeproms (English)
ASP-DAC, 123-128 (1998).
16
Unified complete MOSFET model for analysis of digital and analog circuits. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 15, No. 1, 1-7 (1996).
17
Communication by chaotic signals: The inverse system approach. (English)
Int. J. Circuit Theory Appl. 24, No.5, 551-579 (1996).
18
Modelling and simulating charge sensitive MOS circuits. (English)
Math. Model. Syst. 2, No.1, 69-81 (1996).
19
The DAE-index in electric circuit simulation. (English)
Math. Comput. Simul. 39, No. 5-6, 573-582 (1995).
20
Result 1 to 20 from 27 total
Start
Contact
Print
General Help
