Result 61 to 73 of 73 total
Automatic Pattern Recognition: A Study of the Probability of Error. (English)
IEEE Transactions on Pattern Analysis and Machine Intelligence 10, No.04, 530-543 (1988).
61
Bounds on the Bayes Classification Error Based on Pairwise Risk Functions. (English)
IEEE Transactions on Pattern Analysis and Machine Intelligence 10, No.02, 281-288 (1988).
62
Texture Measures for Carpet Wear Assessment. (English)
IEEE Transactions on Pattern Analysis and Machine Intelligence 10, No.01, 92-105 (1988).
63
Systolic algorithms for string manipulations. (English)
IEEE Trans. Comput. 33, No. 04, 361-364 (1984).
64
Computer science and statistics: proceedings of the 13th Symposium on the Interface, Pittsburgh, Pennsylvania, March 12-13, 1981. (English)
New York - Heidelberg - Berlin: Springer-Verlag. XV, 378 p., 122 figs. DM 59.00; \$ 27.50 (1981).
65
Linear dimension reduction and Bayes classification. (English)
Pattern Recognition 13, 241-243 (1981).
66
Linear feature selection with applications. (English)
Pattern Recognition 11, 55-63 (1979).
67
A distribution-free geometric upper bound for the probability of error of a minimum distance classifier. (English)
Pattern Recognition 10, 281-286 (1978).
68
Artificial patterns. (English)
IEEE Trans. Softw. Eng. 03, No. 04, 301-306 (1977).
69
A projection pursuit algorithm for exploratory data analysis. (English)
IEEE Trans. Comput. 23, No. 09, 881-890 (1974).
70
Distribution-free pattern verification using statistically equivalent blocks. (English)
IEEE Trans. Comput. 21, No. 12, 1337-1347 (1972).
71
Pattern recognition signal processing for mechanical diagnostics signature analysis. (English)
IEEE Trans. Comput. 20, No. 09, 1095-1100 (1971).
72
A nonlinear mapping for data structure analysis. (English)
IEEE Trans. Comput. 18, No. 05, 401-409 (1969).
73
Result 61 to 73 of 73 total
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