Result 1 to 20 of 4057 total
BIST-based fault diagnosis for read-only memories. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 7, 1072-1085 (2011).
1
METER: measuring test effectiveness regionally. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 7, 1058-1071 (2011).
2
An effective and efficient framework for clock latency range aware clock network synthesis. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 7, 1045-1057 (2011).
3
UFO: unified convex optimization algorithms for fixed-outline floorplanning considering pre-placed modules. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 7, 1034-1044 (2011).
4
Safechoice: A novel approach to hypergraph clustering for wirelength-driven placement. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 7, 1020-1033 (2011).
5
A general framework to perform the Max/MIN operations in parameterized statistical timing analysis using information theoretic concepts. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 7, 1011-1019 (2011).
6
Placement and routing for cross-referencing digital microfluidic biochips. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 7, 1000-1010 (2011).
7
Broadcast electrode-addressing and scheduling methods for pin-constrained digital microfluidic biochips. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 7, 986-999 (2011).
8
On phase models for oscillators. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 7, 972-985 (2011).
9
A probe-based harmonic balance method to simulate coupled oscillators. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 7, 960-971 (2011).
10
Error tolerance in server class processors. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 7, 945-959 (2011).
11
Pattern-mining for behavioral synthesis. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 6, 939-944 (2011).
12
Adjoint sensitivity analysis of nonlinear distortion in radio frequency circuits. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 6, 934-939 (2011).
13
An error-tolerance-based test methodology to support product grading for yield enhancement. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 6, 930-934 (2011).
14
A memory built-in self-repair scheme based on configurable spares. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 6, 919-929 (2011).
15
Runtime power management of 3-D multi-core architectures under peak power and temperature constraints. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 6, 905-918 (2011).
16
Reduction of variation-induced energy overhead in multi-core processors. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 6, 891-904 (2011).
17
Robust chip-level clock tree synthesis. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 6, 877-890 (2011).
18
An effective formulation of coupled electromagnetic-TCAD simulation for extremely high frequency onward. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 6, 866-876 (2011).
19
Fast statistical static timing analysis using smart Monte Carlo techniques. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 30, No. 6, 852-865 (2011).
20
Result 1 to 20 of 4057 total