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Result 1 to 20 of 1688 total

Who knew this "experiment" would be so successful? (English)
IEEE Design and Test of Computers 25, No. 04, 392 (2008).
WorldCat.org
1
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TTTC newsletter. (English)
IEEE Design and Test of Computers 25, No. 04, 390-391 (2008).
WorldCat.org
2
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DATC newsletter. (English)
IEEE Design and Test of Computers 25, No. 04, 384 (2008).
WorldCat.org
3
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With pick and shovel through our data. (English)
IEEE Design and Test of Computers 25, No. 04, 382-383 (2008).
WorldCat.org
4
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A digital-microfluidic approach to chip cooling. (English)
IEEE Design and Test of Computers 25, No. 04, 372-381 (2008).
WorldCat.org
5
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The gsrc’s role in meeting tomorrow’s design challenges. (English)
IEEE Design and Test of Computers 25, No. 04, 366-367 (2008).
WorldCat.org
6
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Workloads of the future. (English)
IEEE Design and Test of Computers 25, No. 04, 358-365 (2008).
WorldCat.org
7
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Is a unified methodology for system-level design possible? (English)
IEEE Design and Test of Computers 25, No. 04, 346-357 (2008).
WorldCat.org
8
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Variability and new design paradigms. (English)
IEEE Design and Test of Computers 25, No. 04, 344 (2008).
WorldCat.org
9
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The search for alternative computational paradigms. (English)
IEEE Design and Test of Computers 25, No. 04, 334-343 (2008).
WorldCat.org
10
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The changing design landscape. (English)
IEEE Design and Test of Computers 25, No. 04, 333 (2008).
WorldCat.org
11
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Reliable systems on unreliable fabrics. (English)
IEEE Design and Test of Computers 25, No. 04, 322-332 (2008).
WorldCat.org
12
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The GSRC: Bridging academia and industry. (English)
IEEE Design and Test of Computers 25, No. 04, 321 (2008).
WorldCat.org
13
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The concurrency challenge. (English)
IEEE Design and Test of Computers 25, No. 04, 312-320 (2008).
WorldCat.org
14
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Challenges and solutions for late- and post-silicon design. (English)
IEEE Design and Test of Computers 25, No. 04, 296-302 (2008).
WorldCat.org
15
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Guest editors’ introduction: System IC design challenges beyond 32 nm. (English)
IEEE Design and Test of Computers 25, No. 04, 294-295 (2008).
WorldCat.org
16
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Not just research as usual. (English)
IEEE Design and Test of Computers 25, No. 04, 292 (2008).
WorldCat.org
17
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Bugs, moths, grasshoppers, and whales. (English)
IEEE Design and Test of Computers 25, No. 03, 288 (2008).
WorldCat.org
18
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TTTC newsletter. (English)
IEEE Design and Test of Computers 25, No. 03, 286-287 (2008).
WorldCat.org
19
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Learning to assert yourself. (English)
IEEE Design and Test of Computers 25, No. 03, 284-285 (2008).
WorldCat.org
20
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Result 1 to 20 of 1688 total

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