Result 1 to 13 of 13 total
io-port 70830251 Yamanoue, Takashi;
Fouser, Robert J.;
Wada, Tomohito;
Hidaka, Masayasu;
Suzuki, Yusei;
Terada, Masaharu;
Takenoshita, Akira;
Beppu, Yutoku;
Nedachi, Yoko;
Yukawa, Koji;
Rodriguez, Holmes;
Suenaga, Katsuyuki;
Yamanaka, Yuichi;
Okamura, Toshihiko;
Brasier, Anne Elizabeth;
Seto, Hiroyuki;
Dogome, Kazuhide;
Yamada, Takeshi;
Oto, Noritaka;
Ito, Masakazu;
Nedachi, Munetomo
Information and communication technology infrastructure and management for collaboration with regional universities and colleges (English)
SIGUCCS, 25-30 (2011).
1
Antenna calibration using the 3-antenna method with the in-phase synthetic method (English)
IEICE Transactions 93-B, No. 8, 2158-2164 (2010).
2
Evaluation of uncertainties in electromagnetic disturbance measurement above 1 ghz due to site imperfections (English)
IEICE Transactions 93-B, No. 7, 1690-1696 (2010).
3
Reconstruction of printed image using electromagnetic disturbance from laser printer (English)
IEICE Transactions 90-B, No. 3, 711-715 (2007).
4
Evaluation of information leakage from PC displays using spectrum analyzers (English)
IEICE Transactions 90-B, No. 11, 3315-3318 (2007).
5
A global eddy-resolving coupled physical-biological model: physical influences on a marine ecosystem in the north Pacific (English)
Simulation 82, No. 7, 467-474 (2006).
6
Low frequency equivalent circuit of dual TEM cell for shielding material measurement (English)
IEICE Transactions 89-C, No. 1, 44-50 (2006).
7
APD measurement for evaluating disturbances related to the performance of digital communication systems (English)
IEICE Transactions 88-B, No. 8, 3235-3241 (2005).
8
Human body impedance for contact current measurement in Japan (English)
IEICE Transactions 88-B, No. 8, 3263-3268 (2005).
9
On-line handwritten character pattern database sampled in a sequence of sentences without any writing instructions (English)
ICDAR, 376-381 (1997).
10
Parallel testing of random logic lsis (English)
ITC, 827-833 (1984).
11
A new approach to DC parameter measurement in the day of VLSI (English)
ITC, 362-365 (1983).
12
A pursuit of superior cost-per-performance in general-purpose linear IC test system (English)
ITC, 105-110 (1982).
13
Result 1 to 13 of 13 total