DPDAT: data path direct access testing (English)
ITC, 188-195 (2001).
1
A study of bridging defect probabilities on a pentium (TM) 4 CPU (English)
ITC, 688-695 (2001).
2
Distributed mixed level logic and fault simulation on the pentium$\textregistered $ pro microprocessor (English)
ITC, 160-166 (1996).
3
CHEETA: composition of hierarchical sequential tests using ATKET (English)
ITC, 606-615 (1993).
4
Impact of behavioral learning on the compilation of sequential circuit tests (English)
FTCS, 370-379 (1993).
5
AMBIANT: automatic generation of behavioral modifications for testability (English)
ICCD, 63-66 (1993).
6
Automatic test knowledge extraction from VHDL (ATKET) (English)
DAC, 273-278 (1992).
7