io-port.net

io-port 70226587 Van Der Plas, Geert; Thijs, Steven; Linten, Dimitri; Katti, Guruprasad; Limaye, Paresh; Mercha, Abdelkarim; Stucchi, Michele; Oprins, Herman; Vandevelde, Bart; Minas, Nikolaos; Cupac, Miro; Dehan, Morin; Nelis, Marc; Agarwal, Rahul; Dehaene, Wim; Travaly, Youssef; Beyne, Eric; Marchal, Paul

Verifying electrical/thermal/thermo-mechanical behavior of a 3D stack - challenges and solutions (English)

CICC, 1-4 (2010).

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io-port 70452152 Van Der Plas, Geert; Limaye, Paresh; Mercha, Abdelkarim; Oprins, Herman; Torregiani, Cristina; Thijs, Steven; Linten, Dimitri; Stucchi, Michele; Katti, Guruprasad; Velenis, Dimitrios; Shinichi, Domae; Cherman, Vladimir; Vandevelde, Bart; Simons, Veerle; De Wolf, Ingrid; Labie, Riet; Perry, Dan; Bronckers, Stephane; Minas, Nikolaos; Cupac, Miro; Ruythooren, Wouter; Van Olmen, Jan; Phommahaxay, Alain; De Ten Broeck, Muriel De Potter; Opdebeeck, Ann; Rakowski, Michal; De Wachter, Bart; Dehan, Morin; Nelis, Marc; Agarwal, Rahul; Dehaene, Wim; Travaly, Youssef; Marchal, Pol; Beyne, Eric

Design issues and considerations for low-cost 3D TSV IC technology (English)

ISSCC, 148-149 (2010).

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io-port 70537268 Shi, Lei; Srdanovic, Marko; Beuming, Thijs; Skrabanek, Lucy; Javitch, Jonathan A.; Weinstein, Harel

TRAC: A platform for structure-function studies of NSS-proteins integrates information from bioinformatics and biomedical literature (English)

BIBE, 267-272 (2010).

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io-port 50218725 Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sangameswaran, Sandeep; Sawada, Masanori; Nakaei, Toshiyuki; Hasebe, Takumi; Groeseneken, Guido

ESD on-wafer characterization: is TLP still the right measurement tool? (English)

IEEE T. Instrumentation and Measurement 58, No. 10, 3418-3426 (2009).

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io-port 50233259 Linten, Dimitri; Thijs, Steven; Borremans, Jonathan; Dehan, Morin; Trémouilles, D.; Scholz, Mirko; Natarajan, M. I.; Wambacq, Piet; Decoutere, Stefaan; Groeseneken, Guido

A plug-and-play wideband RF circuit ESD protection methodology: T-diodes (English)

Microelectronics Reliability 49, No. 12, 1440-1446 (2009).

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io-port 70452392 Raczkowski, Kuba; Thijs, Steven; De Raedt, Walter; Nauwelaers, Bart; Wambacq, Piet

50-to-67GHz ESD-protected power amplifiers in digital 45nm LP CMOS (English)

ISSCC, 382-383 (2009).

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io-port 50232214 Trémouilles, D.; Thijs, Steven; Roussel, Philippe; Natarajan, M. I.; Vassilev, Vesselin K.; Groeseneken, Guido

Transient voltage overshoot in TLP testing - real or artifact? (English)

Microelectronics Reliability 47, No. 7, 1016-1024 (2007).

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io-port 50234858 Thijs, Steven; Iyer, M. Natarajan; Linten, Dimitri; Jeamsaksiri, Wutthinan; Daenen, T.; Degraeve, Robin; Scholten, Andries; Decoutere, Stefaan; Groeseneken, Guido

Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS lnas - concepts, constraints and solutions (English)

Microelectronics Reliability 46, No. 5-6, 702-712 (2006).

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io-port 50233927 Vassilev, Vesselin K.; Thijs, Steven; Segura, P. L.; Wambacq, Piet; Leroux, Paul; Groeseneken, Guido; Natarajan, M. I.; Maes, H. E.; Steyaert, Michiel

ESD-RF co-design methodology for the state of the art RF-CMOS blocks (English)

Microelectronics Reliability 45, No. 2, 255-268 (2005).

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io-port 50234173 Vassilev, Vesselin K.; Jenei, S.; Groeseneken, Guido; Venegas, R.; Thijs, Steven; De Heyn, V.; Iyer, M. Natarajan; Steyaert, Michiel; Maes, H. E.

High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices (English)

Microelectronics Reliability 43, No. 7, 1011-1020 (2003).

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