io-port.net

first | previous | 1 | next | last

Result 1 to 5 of 5 total

io-port 50233715 Sauveplane, J. B.; Tounsi, P.; Scheid, E.; Deram, A.

3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET (English)

Microelectronics Reliability 48, No. 8-9, 1464-1467 (2008).

PDF XML AMS-TeX TEXT BIBTeX DOI

io-port 50233816 Fock-Sui-Too, J. L.; Chauchat, B.; Austin, P.; Tounsi, P.; Mermet-Guyennet, Michel; Meuret, R.

Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications (English)

Microelectronics Reliability 48, No. 8-9, 1453-1458 (2008).

PDF XML AMS-TeX TEXT BIBTeX DOI

io-port 50234735 Khong, B.; Legros, M.; Tounsi, P.; Dupuy, Ph.; Chauffleur, X.; Levade, C.; Vanderschaeve, G.; Scheid, E.

Characterization and modelling of ageing failures on power MOSFET devices (English)

Microelectronics Reliability 47, No. 9-11, 1735-1740 (2007).

PDF XML AMS-TeX TEXT BIBTeX DOI

io-port 50233822 Khong, B.; Tounsi, P.; Dupuy, Ph.; Chauffleur, X.; Legros, M.; Deram, A.; Levade, C.; Vanderschaeve, G.; Dorkel, J. M.; Fradin, J. P.

Innovative methodology for predictive reliability of intelligent power devices using extreme electro-thermal fatigue (English)

Microelectronics Reliability 45, No. 9-11, 1717-1722 (2005).

PDF XML AMS-TeX TEXT BIBTeX DOI

io-port 50232405 Perat, O.; Dorkel, J. M.; Scheid, E.; Temple-Boyer, Pierre; Chung, Y. S.; Peyre-Lavigne, A.; Zecri, M.; Tounsi, P.

Characterization method of thermomechanical parameters for microelectronic materials (English)

Microelectronics Reliability 42, No. 7, 1053-1058 (2002).

PDF XML AMS-TeX TEXT BIBTeX DOI

first | previous | 1 | next | last

Result 1 to 5 of 5 total