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Result 1 to 20 of 67 total

Co-optimization of circuits, layout and lithography for predictive technology scaling beyond gratings. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 29, No. 4, 509-527 (2010).
WorldCat.org
1
Creating an affordable 22nm node using design-lithography co-optimization (English)
DAC, 95-96 (2009).
WorldCat.org
3
Guest Editors’ Introduction: DFM Drives Changes in Design Flow. (English)
IEEE Design and Test of Computers 22, No.03, 200-205 (2005).
WorldCat.org
5
Guest editors’ introduction: DFM drives changes in design flow (English)
IEEE Design & Test of Computers 22, No. 3, 200-205 (2005).
WorldCat.org
6
Statistical critical path analysis considering correlations (English)
PATMOS, 364-373 (2005).
WorldCat.org
7
Tutorial on DFM for physical design (English)
ISPD, 103 (2005).
WorldCat.org
8
Correlation-aware statistical timing analysis with non-Gaussian delay distributions (English)
DAC, 77-82 (2005).
WorldCat.org
9
Design methodology for IC manufacturability based on regular logic-bricks (English)
DAC, 353-358 (2005).
WorldCat.org
10
Statistical critical path analysis considering correlations (English)
ICCAD, 699-704 (2005).
WorldCat.org
11
Projection-based performance modeling for inter/intra-die variations (English)
ICCAD, 721-727 (2005).
WorldCat.org
12
Routing architecture exploration for regular fabrics (English)
DAC, 204-207 (2004).
WorldCat.org
13
Global and local congestion optimization in technology mapping. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 22, No. 4, 498-505 (2003).
WorldCat.org
15
Bounding the efforts on congestion optimization for physical synthesis (English)
ACM Great Lakes Symposium on VLSI, 7-10 (2003).
WorldCat.org
16
Exploring regular fabrics to optimize the performance-cost trade-off (English)
DAC, 782-787 (2003).
WorldCat.org
17
Understanding and addressing the impact of wiring congestion during technology mapping (English)
ISPD, 131-136 (2002).
WorldCat.org
18
Congestion-aware logic synthesis (English)
DATE, 664-671 (2002).
WorldCat.org
19
Path delay fault diagnosis and coverage-a metric and an estimationtechnique. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 20, No. 3, 440-457 (2001).
WorldCat.org
20
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Result 1 to 20 of 67 total

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