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Result 1 to 20 of 25 total

Implementation of a new offset generator block for the low-voltage, low-power self biased threshold voltage extractor circuit. (English)
Rahaman, Hafizur (ed.) et al., Progress in VLSI design and test. 16th international symposium, VDAT 2012, Shibpur, India, July 1‒4, 2012. Proceedings. Berlin: Springer (ISBN 978-3-642-31493-3/pbk). Lecture Notes in Computer Science 7373, 156-165 (2012).
WorldCat.org
1
Effects of $La_{2}O_{3}$ incorporation in $HfO_{2}$ gated nmosfets on low-frequency noise (English)
Microelectronics Reliability 51, No. 4, 746-750 (2011).
WorldCat.org
2
Study of hafnium oxide deposited using dense plasma focus machine for film structure and electrical properties as a MOS device (English)
Microelectronics Reliability 51, No. 4, 751-755 (2011).
WorldCat.org
3
Online and offline interactions in online communities (English)
Int. Sym. Wikis, 39-48 (2011).
WorldCat.org
4
Electron transport in two dimensional electron gas formed at the heterojunction of $Al_{x}Ga_{(1-}_{x}_{)}$N/gan at microwave frequencies (English)
Microelectronics Reliability 50, No. 7, 965-970 (2010).
WorldCat.org
5
Using taxonomies to perform aggregated querying over imprecise data (English)
ICDM Workshops, 989-996 (2010).
WorldCat.org
6
The impact of visual and background music congruity on media commercial’s information effectiveness (English)
IKE, 120-126 (2010).
WorldCat.org
7
Remote automated user testing: first steps toward a general-purpose tool (English)
SERA (selected papers), 37-50 (2010).
WorldCat.org
8
MIMO based multimedia communication system. (English)
Comput. Res. Repos. 2009, Article No. 0903.1511 (2009).
WorldCat.org
9
Investigation of novel attributes of single halo dual-material double gate mosfets for analog/RF applications (English)
Microelectronics Reliability 49, No. 12, 1491-1497 (2009).
WorldCat.org
10
Study of gate dielectric permittivity variation with different equivalent oxide thickness on channel engineered deep sub-micrometer n-MOSFET device for mixed signal applications (English)
Microelectronics Reliability 49, No. 4, 365-370 (2009).
WorldCat.org
11
Study on the performance of sub 100 nm LACLATI mosfets for digital application (English)
Microelectronics Reliability 49, No. 4, 392-396 (2009).
WorldCat.org
12
Finding answers: A case study on communicating knowledge within a software development team (English)
Software Engineering Research and Practice, 195-201 (2009).
WorldCat.org
13
A threshold voltage model for short-channel mosfets taking into account the varying depth of channel depletion layers around the source and drain (English)
Microelectronics Reliability 48, No. 1, 17-22 (2008).
WorldCat.org
14
Realization of quantum dot Boolean logic gate for image processing applications (English)
J. Electronic Imaging 16, No. 2, 023003 (2007).
WorldCat.org
15
Performance comparison of channel engineered deep sub-micrometer pseudo SOI n-mosfets (English)
Microelectronics Reliability 47, No. 6, 953-958 (2007).
WorldCat.org
16
The role of social networks in students’ learning experiences (English)
SIGCSE Bulletin 39, No. 4, 224-237 (2007).
WorldCat.org
17
Circuit prospects of DGFET: variable gain differential amplifier an a schmitt trigger with adjustable hysteresis (English)
VLSI-SoC, 280-283 (2007).
WorldCat.org
18
Tracking website data-collection and privacy practices with the iwatch web crawler (English)
SOUPS, 29-40 (2007).
WorldCat.org
19
Comparative studies on electronic transport due to the reduced dimensionality at the heterojunctions of $GaAs/a1_{x}ga_{(1-x)}$As and $Ga_{x}In_{(1-x)}$As/inp systems at low temperatures (English)
Microelectronics Journal 37, No. 8, 735-741 (2006).
WorldCat.org
20
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Result 1 to 20 of 25 total

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