io-port.net

io-port 70689926 Mitra, Subhasish; Brelsford, Kevin; Sanda, Pia N.

Cross-layer resilience challenges: metrics and optimization (English)

DATE, 1029-1034 (2010).

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io-port 70580278 Martincic-Ipsic, Sanda; Pobar, Miran; Ipsic, Ivo

Automatic evaluation of synthesized speech (English)

ITI, 305-310 (2009).

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io-port 05420776 Bender, Carl A.; Sanda, Pia N.; Kudva, Prabhakar; Mata, Ricardo; Pokala, Vikas; Haraden, Ryan; Schallhorn, Matthew

Soft-error resilience of the IBM POWER6 processor input/output subsystem. (English)

IBM J. Res. Dev. 52, No. 3, 285-292 (2008).

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io-port 05420767 Sanda, Pia N.; Kellington, Jeffrey W.; Kudva, Prabhakar; Kalla, Ronald; Mcbeth, Ryan B.; Ackaret, Jerry; Lockwood, Ryan; Schumann, John; Jones, Christopher R.

Soft-error resilience of the IBM POWER6 processor. (English)

IBM J. Res. Dev. 52, No. 3, 275-284 (2008).

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io-port 05420753 Rivers, Jude A.; Bose, Pradip; Kudva, Prabhakar; Wellman, John-David; Sanda, Pia N.; Cannon, Ethan H.; Alves, Luiz C.

Phaser: Phased methodology for modeling the system-level effects of soft errors. (English)

IBM J. Res. Dev. 52, No. 3, 293-306 (2008).

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io-port 05334577 Reick, Kevin; Sanda, Pia N.; Swaney, Scott; Kellington, Jeffrey W.; Mack, Michael; Floyd, Michael; Henderson, Daniel

Fault-tolerant design of the IBM power6 microprocessor. (English)

IEEE Micro 28, No. 02, 30-38 (2008).

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io-port 50152270 Reick, Kevin; Sanda, Pia N.; Swaney, Scott B.; Kellington, Jeffrey W.; Mack, Michael J.; Floyd, Michael S.; Henderson, Daniel

Fault-tolerant design of the IBM power6 microprocessor (English)

IEEE Micro 28, No. 2, 30-38 (2008).

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io-port 70279043 Ramachandran, Pradeep; Kudva, Prabhakar; Kellington, Jeffrey W.; Schumann, John; Sanda, Pia

Statistical fault injection (English)

DSN, 122-127 (2008).

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io-port 70690973 Gizopoulos, Dimitris; Roy, Kaushik; Mitra, Subhasish; Sanda, Pia

Soft errors: system effects, protection techniques and case studies (English)

DATE (2008).

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io-port 70887914 Mitra, Subhasish; Sanda, Pia; Seifert, Norbert

Soft errors: technology trends, system effects, and protection techniques (English)

IOLTS, 4 (2007).

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io-port 05075483 Lansky, Petr; Sanda, Pavel; He, Jufang

The parameters of the stochastic leaky integrate-and-fire neuronal model. (English)

J. Comput. Neurosci. 21, No. 2, 211-223 (2006).

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io-port 50076444 Lánský, Petr; Sanda, Pavel; He, Jufang

The parameters of the stochastic leaky integrate-and-fire neuronal model (English)

Journal of Computational Neuroscience 21, No. 2, 211-223 (2006).

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io-port 05098761 Adve, Sarita V.; Sanda, Pia

Guest Editors’ Introduction: Reliability-Aware Microarchitecture. (English)

IEEE Micro 25, No.06, 8-9 (2005).

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io-port 50152218 Adve, Sarita V.; Sanda, Pia

Guest editors’ introduction: reliability-aware microarchitecture (English)

IEEE Micro 25, No. 6, 8-9 (2005).

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io-port 50232297 Stellari, Franco; Song, Peilin; Mcmanus, Moyra K.; Weger, Alan J.; Gauthier, Robert; Chatty, Kiran V.; Muhammad, Mujahid; Sanda, Pia; Wu, Philip; Wilson, Steve

Latchup analysis using emission microscopy (English)

Microelectronics Reliability 43, No. 9-11, 1603-1608 (2003).

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io-port 70056436 Stellari, Franco; Song, Peilin; Mcmanus, Moyra K.; Gauthier, Robert; Weger, Alan J.; Chatty, Kiran V.; Muhammad, Mujahid; Sanda, Pia

Optical and electrical testing of latchup in I/O interface circuits (English)

ITC, 236-245 (2003).

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io-port 70179956 Polonsky, Stanislav; Mcmanus, Moyra K.; Knebel, Daniel R.; Steen, Steve; Sanda, Pia

Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis (English)

Asian Test Symposium, 125- (2000).

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io-port 70057294 Huott, William V.; Mcmanus, Moyra K.; Knebel, Daniel R.; Steen, Steve; Manzer, Dennis; Sanda, Pia; Wilson, Steve; Chan, Yuen H.; Pelella, Antonio; Polonsky, Stanislav

The attack of the "holey shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA) (English)

ITC, 883-891 (1999).

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io-port 70056085 Knebel, Daniel R.; Sanda, Pia; Mcmanus, Moyra K.; Kash, Jeffrey A.; Tsang, James C.; Vallett, David P.; Huisman, Leendert M.; Nigh, Phil; Rizzolo, Rick; Song, Peilin; Motika, Franco

Diagnosis and characterization of timing-related defects by time-dependent light emission (English)

ITC, 733-739 (1998).

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