io-port.net

io-port 50134048 Cullen, G.; Guillet, J. -Ph.; Heinrich, G.; Kleinschmidt, T.; Pilon, E.; Reiter, T.; Rodgers, M.

Golem95c: A library for one-loop integrals with complex masses (English)

Computer Physics Communications 182, No. 10, 2276-2284 (2011).

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io-port 70403592 Kolter, J. Zico; Rodgers, Mike P.; Ng, Andrew Y.

A control architecture for quadruped locomotion over rough terrain (English)

ICRA, 811-818 (2008).

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io-port 50234165 Fleetwood, Daniel M.; Rodgers, M. P.; Tsetseris, L.; Zhou, X. J.; Batyrev, I.; Wang, S.; Schrimpf, Ronald D.; Pantelides, Sokrates T.

Effects of device aging on microelectronics radiation response and reliability (English)

Microelectronics Reliability 47, No. 7, 1075-1085 (2007).

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io-port 05439581 Reilly, Derek F.; Rodgers, Malcolm E.; Argue, Ritchie; Nunes, Mike; Inkpen, Kori

Marked-up maps: Combining paper maps and electronic information resources. (English)

Pers. Ubiquitous Comput 10, No. 4, 215-226 (2006).

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io-port 70132689 Rodgers, Malcolm E.; Mandryk, Regan L.; Inkpen, Kori M.

Smart sticky widgets: pseudo-haptic enhancements for multi-monitor displays (English)

Smart Graphics, 194-205 (2006).

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io-port 70542518 Khoche, Ajay; Rodgers, Mike; O’neil, Pete

Session abstract (English)

VTS, 426 (2006).

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io-port 70880920 Kellar, Melanie; Reilly, Derek F.; Hawkey, Kirstie; Rodgers, Malcolm E.; Mackay, Bonnie; Dearman, David; Ha, Vicki; Macinnes, W. Joseph; Nunes, Michael N.; Parker, Karen; Whalen, Tara; Inkpen, Kori M.

It’s a jungle out there: practical considerations for evaluation in the city (English)

CHI Extended Abstracts, 1533-1536 (2005).

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io-port 70887324 Mandryk, Regan L.; Rodgers, Malcolm E.; Inkpen, Kori M.

Sticky widgets: pseudo-haptic widget enhancements for multi-monitor displays (English)

CHI Extended Abstracts, 1621-1624 (2005).

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io-port 05448131 Hamdioui, Said; Al-Ars, Zaid; Van De Goor, A.J.; Rodgers, Mike

Linked faults in random access memories: Concept, fault models, test algorithms, and industrial results. (English)

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 23, No. 5, 737-757 (2004).

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io-port 05391888 Lennert, Joseph F.; Retzner, William; Rodgers, Monica G.; Ruel, Bernard G.; Sundararajan, Srini; Wolfson, Paul D.

The automated backup solution - safeguarding the communications network infrastructure. (English)

Bell Labs Tech. J. 9, No. 2, 59-84 (2004).

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io-port 05087075 Edenfeld, Don; Kahng, Andrew B.; Rodgers, Mike; Zorian, Yervant

2003 Technology Roadmap for Semiconductors. (English)

Computer 37, No.01, 47-56 (2004).

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io-port 50250949 Edenfeld, Don; Kahng, Andrew B.; Rodgers, Mike; Zorian, Yervant

2003 technology roadmap for semiconductors (English)

IEEE Computer 37, No. 1, 47-56 (2004).

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io-port 50353190 Hamdioui, Said; Al-Ars, Zaid; Van De Goor, A. J.; Rodgers, Mike

Dynamic faults in random-access-memories: concept, fault models and tests (English)

J. Electronic Testing 19, No. 2, 195-205 (2003).

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io-port 70180275 Hamdioui, Said; Al-Ars, Zaid; Van De Goor, A. J.; Rodgers, Mike

March SL: A test for all static linked memory faults (English)

Asian Test Symposium, 372-377 (2003).

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io-port 70543362 Hamdioui, Said; Van De Goor, A. J.; Rodgers, Mike

Detecting intra-word faults in word-oriented memories (English)

VTS, 241-247 (2003).

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io-port 05087014 Allan, Alan; Edenfeld, Don; Joyner, Jr., William H.; Kahng, Andrew B.; Rodgers, Mike; Zorian, Yervant

2001 Technology Roadmap for Semiconductors. (English)

Computer 35, No.01, 42-53 (2002).

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io-port 50249539 Allan, Alan; Edenfeld, Don; Jr., William H. Joyner; Kahng, Andrew B.; Rodgers, Mike; Zorian, Yervant

2001 technology roadmap for semiconductors (English)

IEEE Computer 35, No. 1, 42-53 (2002).

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io-port 70542951 Mccluskey, Edward J.; Mitra, Subhasish; Madge, Bob; Maxwell, Peter C.; Nigh, Phil; Rodgers, Mike

Debating the future of burn-in (English)

VTS, 311-314 (2002).

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io-port 70909678 Hamdioui, Said; Van De Goor, A. J.; Rodgers, Mike

March SS: A test for all static simple RAM faults (English)

MTDT, 95-100 (2002).

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io-port 70180283 Hamdioui, Said; Van De Goor, A. J.; Eastwick, David; Rodgers, Mike

Detecting unique faults in multi-port srams (English)

Asian Test Symposium, 37-42 (2001).

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