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Result 1 to 20 of 36 total

A multivariate adaptive stochastic search method for dimensionality reduction in classification. (English)
Ann. Appl. Stat. 4, No. 1, 340-365 (2010).
WorldCat.org
1
Data reduction in classification: A simulated annealing based projection method (English)
Statistical Analysis and Data Mining 3, No. 5, 319-331 (2010).
WorldCat.org
2
Robust multivariate regression when there is heteroscedasticity (English)
Communications in Statistics - Simulation and Computation 38, No. 1, 1-13 (2009).
WorldCat.org
3
Comparing robust measures of association estimated via a smoother (English)
Communications in Statistics - Simulation and Computation 38, No. 9, 1969-1979 (2009).
WorldCat.org
4
Comparing Pearson correlations: dealing with heteroscedasticity and nonnormality (English)
Communications in Statistics - Simulation and Computation 38, No. 10, 2220-2234 (2009).
WorldCat.org
5
Trigonometric simplification of a class of conservative nonlinear oscillators. (English)
Nonlinear Dyn. 49, No. 1-2, 193-201 (2007).
WorldCat.org
6
Nonparametric and robust methods (English)
Computational Statistics & Data Analysis 51, No. 10, 5010-5012 (2007).
WorldCat.org
8
Impact of interconnect length changes on effective materials properties (dielectric constant) (English)
SLIP, 73-80 (2007).
WorldCat.org
9
Pairwise comparisons of dependent groups based on medians (English)
Computational Statistics & Data Analysis 50, No. 10, 2933-2941 (2006).
WorldCat.org
10
Comparing medians (English)
Computational Statistics & Data Analysis 51, No. 3, 1934-1943 (2006).
WorldCat.org
11
Microminiature packaging and integrated circuitry: The work of E. F. rent, with an application to on-chip interconnection requirements. (English)
IBM J. Res. Dev. 49, No. 4-5, 777-803 (2005).
WorldCat.org
12
Predicting interconnect requirements in ultra-large-scale integrated control logic circuitry (English)
SLIP, 43-50 (2005).
WorldCat.org
14
Interpretation of rent’s rule for ultralarge-scale integrated circuit designs, with an application to wirelength distribution models. (English)
IEEE Trans. VLSI Syst. 12, No. 12, 1330-1347 (2004).
WorldCat.org
16
Assessment of on-chip wire-length distribution models. (English)
IEEE Trans. VLSI Syst. 12, No. 10, 1108-1112 (2004).
WorldCat.org
17
Inferences based on multiple skipped correlations (English)
Computational Statistics & Data Analysis 44, No. 1-2, 223-236 (2003).
WorldCat.org
18
io-port 70092379 Adiga, Narasimha R.; Almási, George; Aridor, Yariv; Barik, Rajkishore; Beece, Daniel K.; Bellofatto, Ralph; Bhanot, Gyan; Bickford, Randy; Blumrich, Matthias A.; Bright, Arthur A.; Brunheroto, José R.; Cascaval, Calin; Castaños, José G.; Chan, W.; Ceze, Luis; Coteus, Paul; Chatterjee, Siddhartha; Chen, Dong; Chiu, George L. -T.; Cipolla, Thomas M.; Crumley, Paul; Desai, K. M.; Deutsch, Alina; Domany, Tamar; Dombrowa, Marc Boris; Donath, Wilm E.; Eleftheriou, Maria; Erway, C. Christopher; Esch, J.; Fitch, Blake G.; Gagliano, Joseph; Gara, Alan; Garg, Rahul; Germain, Robert S.; Giampapa, Mark; Gopalsamy, Balaji; Gunnels, John A.; Gupta, Manish; Gustavson, Fred G.; Hall, Shawn; Haring, Ruud A.; Heidel, David F.; Heidelberger, Philip; Herger, Lorraine; Hoenicke, Dirk; Jackson, R. D.; Jamal-Eddine, T.; Kopcsay, Gerard V.; Krevat, Elie; Kurhekar, Manish P.; Lanzetta, Alphonso P.; Lieber, Derek; Liu, L. K.; Lu, M.; Mendell, Mark P.; Misra, A.; Moatti, Y.; Mok, Lawrence S.; Moreira, José E.; Nathanson, Ben J.; Newton, Matthew; Ohmacht, Martin; Oliner, Adam J.; Pandit, Vinayaka; Pudota, R. B.; Rand, Rick A.; Regan, Richard D.; Rubin, Bradley; Ruehli, Albert E.; Rus, Silvius; Sahoo, Ramendra K.; Sanomiya, Alda; Schenfeld, Eugen; Sharma, M.; Shmueli, Edi; Singh, Sarabjeet; Song, Peilin; Srinivasan, Vijay; Steinmacher-Burow, Burkhard D.; Strauss, Karin; Surovic, Christopher W.; Swetz, Richard A.; Takken, Todd; Tremaine, R. Brett; Tsao, Mickey; Umamaheshwaran, Arun R.; Verma, P.; Vranas, Pavlos; Ward, T. J. Christopher; Wazlowski, Michael E.; Barrett, W.; Engel, C.; Drehmel, B.; Hilgart, B.; Hill, D.; Kasemkhani, F.; Krolak, David J.; Li, C. T.; Liebsch, Thomas A.; Marcella, James A.; Muff, A.; Okomo, A.; Rouse, M.; Schram, A.; Tubbs, M.; Ulsh, G.; Wait, Charles D.; Wittrup, J.; Bae, M.; Dockser, Kenneth A.; Kissel, Lynn; Seager, Mark K.; Vetter, Jeffrey S.; Yates, K.
An overview of the bluegene/L supercomputer (English)
SC, 1-22 (2002).
WorldCat.org
19
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