A laser altimeter performance model and its application to BELA (English)
IEEE T. Geoscience and Remote Sensing 44, No. 11-2, 3308-3319 (2006).
1
Gate voltage and oxide thickness dependence of progressive wear-out of ultra-thin gate oxides (English)
Microelectronics Reliability 46, No. 9-11, 1603-1607 (2006).
2
Voltage acceleration of time-dependent breakdown of ultra-thin gate dielectrics (English)
Microelectronics Reliability 45, No. 12, 1835-1841 (2005).
3
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