History
1
au:Peyre-Lavigne, A*
1


Please fill in your query. A complete syntax description you will find on the General Help page.
Characterization method of thermomechanical parameters for microelectronic materials (English)
Microelectronics Reliability 42, No. 7, 1053-1058 (2002).
WorldCat.org
PDF XML AMS-TeX TEXT BIBTeX DOI
Valid XHTML 1.0 Transitional Valid CSS!