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"Condition-based" dummy fill insertion method based on ECP and CMP predictive models (English)
ISQED, 198-205 (2010).
WorldCat.org
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Non-Gaussian statistical timing models of die-to-die and within-die parameter variations for full chip analysis (English)
ASP-DAC, 292-297 (2008).
WorldCat.org
2
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