Result 1 to 20 of 28 total
How many test patterns are useless? (English)
VTS, 23-28 (2008).
1
The evolving role of test $\dots $it is now a "value add" operation (English)
DFT, 3-3 (2008).
2
Guest Editor’s Introduction: Evolving Methods for Detecting and Handling Reliability Defects. (English)
IEEE Design and Test of Computers 23, No.02, 86-87 (2006).
3
Guest editor’s introduction: evolving methods for detecting and handling reliability defects (English)
IEEE Design & Test of Computers 23, No. 2, 86-87 (2006).
4
Session abstract (English)
VTS, 44 (2006).
5
Defect-oriented test for ultra-low DPM (English)
Asian Test Symposium, 455 (2005).
6
Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions (English)
ITC, 309-318 (2004).
7
Achieving quality levels of 100dpm: it’s possible - but roll up your sleeves and be prepared to do some work (English)
ITC, 1420 (2004).
8
Redefining ATE: "data collection engines that drive yield learning and process optimization" (English)
ITC, 1429 (2004).
9
The increasing importance of on-line testing to ensure high-reliability products (English)
ITC, 1281 (2003).
10
Scan-based testing: the only practical solution for testing ASIC/consumer products (English)
ITC, 1198 (2002).
11
Debating the future of burn-in (English)
VTS, 311-314 (2002).
12
MINVDD testing for weak CMOS ics (English)
VTS, 339-345 (2001).
13
Test method evaluation experiments and data (English)
ITC, 454-463 (2000).
14
Failure analysis of timing and iddq-only failures from the SEMATECH test methods experiment (English)
ITC, 1152-1161 (1999).
15
io-port 70056085 Knebel, Daniel R.;
Sanda, Pia;
Mcmanus, Moyra K.;
Kash, Jeffrey A.;
Tsang, James C.;
Vallett, David P.;
Huisman, Leendert M.;
Nigh, Phil;
Rizzolo, Rick;
Song, Peilin;
Motika, Franco
Diagnosis and characterization of timing-related defects by time-dependent light emission (English)
ITC, 733-739 (1998).
16
Failure analysis of timing and iddq-only failures from the SEMATECH test methods experiment (English)
ITC, 43- (1998).
17
Best methods for at-speed testing? (English)
VTS, 460-461 (1998).
18
Binning for IC quality: experimental studies on the SEMATECH data (English)
DFT, 4-10 (1998).
19
Screening for known good die (KGD) based on defect clustering: an experimental study (English)
ITC, 362-369 (1997).
20
Result 1 to 20 of 28 total
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