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io-port 50233856 Haller, Gerald; Machouat, Aziz; Lewis, Dean; Pouget, Vincent

Net integrity checking by optical localization techniques (English)

Microelectronics Reliability 49, No. 9-11, 1175-1181 (2009).

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io-port 50233578 Machouat, Aziz; Haller, G.; Goubier, Vincent; Lewis, Dean; Perdu, Philippe; Pouget, Vincent; Fouillat, Pascal; Essely, F.

Effect of physical defect on shmoos in CMOS DSM technologies (English)

Microelectronics Reliability 48, No. 8-9, 1333-1338 (2008).

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io-port 50235211 Ferrigno, Julie; Machouat, Aziz; Perdu, Philippe; Lewis, Dean; Haller, Gerald; Goubier, Vincent

Generic simulator for faulty IC (English)

Microelectronics Reliability 48, No. 8-9, 1592-1596 (2008).

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