Modeling time domain magnetic emissions of ICs. (English)
van Leuken, René (ed.) et al., Integrated circuit and system design. Power and timing modeling, optimization, and simulation. 20th international workshop, PATMOS 2010, Grenoble, France, September 7‒10, 2010. Revised selected papers. Berlin: Springer (ISBN 978-3-642-17751-4/pbk). Lecture Notes in Computer Science 6448, 238-249 (2011).
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Local and direct EM injection of power into CMOS integrated circuits (English)
FDTC, 100-104 (2011).
2
Modeling time domain magnetic emissions of ics (English)
PATMOS, 238-249 (2010).
3
Near-field mapping system to scan in time domain the magnetic emissions of integrated circuits. (English)
Svensson, Lars (ed.) et al., Integrated circuit and system design. Power and timing modeling, optimization and simulation. 18th international workshop, PATMOS 2008, Lisbon, Portugal, September 10‒12, 2008. Revised selected papers. Berlin: Springer (ISBN 978-3-540-95947-2/pbk). Lecture Notes in Computer Science 5349, 229-236 (2009).
4
Electrical modeling of the effect of beam profile for pulsed laser fault injection (English)
Microelectronics Reliability 49, No. 9-11, 1143-1147 (2009).
5
Near-field mapping system to scan in time domain the magnetic emissions of integrated circuits (English)
PATMOS, 229-236 (2008).
6
Signoff power methodology for contactless smartcards (English)
ISLPED, 407-410 (2007).
7
Methodology for dynamic power verification of contactless smartcards (English)
PATMOS, 280-291 (2006).
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