Fault detection for batch monitoring and discrete wavelet transforms (English)
Quality and Reliability Eng. Int. 27, No. 8, 999-1008 (2011).
1
Feature extraction and classification models for high-dimensional profile data (English)
Quality and Reliability Eng. Int. 27, No. 7, 885-893 (2011).
2
io-port 70894755 Fowler, John W.;
Fu, Michael C.;
Schruben, Lee;
Brown, Steven;
Chance, Frank;
Cunningham, Sean;
Hilton, Courtland;
Janakiram, Mani;
Stafford, Richard;
Hutchby, James
Operational modeling and simulation in semiconductor manufacturing (English)
Winter Simulation Conference, 1035 (1998).
3
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