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Result 1 to 10 of 10 total

Preface. (English)
IBM J. Res. Dev. 52, No. 3, 223-224 (2008).
WorldCat.org
1
Alpha-particle-induced upsets in advanced CMOS circuits and technology. (English)
IBM J. Res. Dev. 52, No. 3, 225-232 (2008).
WorldCat.org
2
New simulation methodology for effects of radiation in semiconductor chip structures. (English)
IBM J. Res. Dev. 52, No. 3, 245-254 (2008).
WorldCat.org
3
Single-event-upset and alpha-particle emission rate measurement techniques. (English)
IBM J. Res. Dev. 52, No. 3, 265-274 (2008).
WorldCat.org
4
A pulsed low-voltage swing latch for reduced power dissipation in high-frequency microprocessors (English)
ISLPED, 85-88 (2006).
WorldCat.org
5
Single-event-upset trends in advanced CMOS technologies (English)
DFT (2006).
WorldCat.org
6
io-port 70092379 Adiga, Narasimha R.; Almási, George; Aridor, Yariv; Barik, Rajkishore; Beece, Daniel K.; Bellofatto, Ralph; Bhanot, Gyan; Bickford, Randy; Blumrich, Matthias A.; Bright, Arthur A.; Brunheroto, José R.; Cascaval, Calin; Castaños, José G.; Chan, W.; Ceze, Luis; Coteus, Paul; Chatterjee, Siddhartha; Chen, Dong; Chiu, George L. -T.; Cipolla, Thomas M.; Crumley, Paul; Desai, K. M.; Deutsch, Alina; Domany, Tamar; Dombrowa, Marc Boris; Donath, Wilm E.; Eleftheriou, Maria; Erway, C. Christopher; Esch, J.; Fitch, Blake G.; Gagliano, Joseph; Gara, Alan; Garg, Rahul; Germain, Robert S.; Giampapa, Mark; Gopalsamy, Balaji; Gunnels, John A.; Gupta, Manish; Gustavson, Fred G.; Hall, Shawn; Haring, Ruud A.; Heidel, David F.; Heidelberger, Philip; Herger, Lorraine; Hoenicke, Dirk; Jackson, R. D.; Jamal-Eddine, T.; Kopcsay, Gerard V.; Krevat, Elie; Kurhekar, Manish P.; Lanzetta, Alphonso P.; Lieber, Derek; Liu, L. K.; Lu, M.; Mendell, Mark P.; Misra, A.; Moatti, Y.; Mok, Lawrence S.; Moreira, José E.; Nathanson, Ben J.; Newton, Matthew; Ohmacht, Martin; Oliner, Adam J.; Pandit, Vinayaka; Pudota, R. B.; Rand, Rick A.; Regan, Richard D.; Rubin, Bradley; Ruehli, Albert E.; Rus, Silvius; Sahoo, Ramendra K.; Sanomiya, Alda; Schenfeld, Eugen; Sharma, M.; Shmueli, Edi; Singh, Sarabjeet; Song, Peilin; Srinivasan, Vijay; Steinmacher-Burow, Burkhard D.; Strauss, Karin; Surovic, Christopher W.; Swetz, Richard A.; Takken, Todd; Tremaine, R. Brett; Tsao, Mickey; Umamaheshwaran, Arun R.; Verma, P.; Vranas, Pavlos; Ward, T. J. Christopher; Wazlowski, Michael E.; Barrett, W.; Engel, C.; Drehmel, B.; Hilgart, B.; Hill, D.; Kasemkhani, F.; Krolak, David J.; Li, C. T.; Liebsch, Thomas A.; Marcella, James A.; Muff, A.; Okomo, A.; Rouse, M.; Schram, A.; Tubbs, M.; Ulsh, G.; Wait, Charles D.; Wittrup, J.; Bae, M.; Dockser, Kenneth A.; Kissel, Lynn; Seager, Mark K.; Vetter, Jeffrey S.; Yates, K.
An overview of the bluegene/L supercomputer (English)
SC, 1-22 (2002).
WorldCat.org
7
High-speed serializing/de-serializing design-for-test method for evaluating a 1 ghz microprocessor (English)
VTS, 234-238 (1998).
WorldCat.org
10
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Result 1 to 10 of 10 total

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