Result 1 to 10 of 10 total
Preface. (English)
IBM J. Res. Dev. 52, No. 3, 223-224 (2008).
1
Alpha-particle-induced upsets in advanced CMOS circuits and technology. (English)
IBM J. Res. Dev. 52, No. 3, 225-232 (2008).
2
New simulation methodology for effects of radiation in semiconductor chip structures. (English)
IBM J. Res. Dev. 52, No. 3, 245-254 (2008).
3
Single-event-upset and alpha-particle emission rate measurement techniques. (English)
IBM J. Res. Dev. 52, No. 3, 265-274 (2008).
4
A pulsed low-voltage swing latch for reduced power dissipation in high-frequency microprocessors (English)
ISLPED, 85-88 (2006).
5
Single-event-upset trends in advanced CMOS technologies (English)
DFT (2006).
6
High-speed serializing/de-serializing design-for-test method for evaluating a 1 ghz microprocessor (English)
VTS, 234-238 (1998).
10
Result 1 to 10 of 10 total