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Ngan, Henry Y. T.; Pang, Grantham K. H.; Yung, Nelson H. C. Motif-based defect detection for patterned fabric. (English) Zbl 1132.68652 Pattern Recognition 41, No. 6, 1878-1894 (2008). MSC: 68T10 PDFBibTeX XMLCite \textit{H. Y. T. Ngan} et al., Pattern Recognition 41, No. 6, 1878--1894 (2008; Zbl 1132.68652) Full Text: DOI
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Grantham, Walter J.; Chingcuanco, Alfredo O. Lyapunov steepest descent control of constrained linear systems. (English) Zbl 0541.93057 IEEE Trans. Autom. Control 29, 740-743 (1984). MSC: 93D05 90C99 93C05 34D20 93B50 93D20 PDFBibTeX XMLCite \textit{W. J. Grantham} and \textit{A. O. Chingcuanco}, IEEE Trans. Autom. Control 29, 740--743 (1984; Zbl 0541.93057) Full Text: DOI