io-port 50232136 Douglas, E. A.;
Chang, C. Y.;
Cheney, D. J.;
Gila, B. P.;
Lo, C. F.;
Lu, Liu;
Holzworth, R.;
Whiting, P.;
Jones, K.;
Via, G. D.;
Kim, Jinhyung;
Jang, Soohwan;
Ren, Fan;
Pearton, S. J.
Algan/gan high electron mobility transistor degradation under on- and off-state stress (English)
Microelectronics Reliability 51, No. 2, 207-211 (2011).
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