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Next generation of deep trench isolation for smart power technologies with 120 V high-voltage devices (English)
Microelectronics Reliability 50, No. 9-11, 1758-1762 (2010).
WorldCat.org
1
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Thermal resistance assessment in multi-trenched power devices (English)
Microelectronics Reliability 48, No. 8-9, 1479-1484 (2008).
WorldCat.org
2
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A reversible carry-look-ahead adder using control gates. (English)
Integr., VLSI J. 33, No.1-2, 89-104 (2002).
Classification: C.1
WorldCat.org
3
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Design of reversible logic circuits by means of control gates (English)
PATMOS, 255-264 (2000).
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4
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