Result 1 to 20 of 21 total
An explicit multi-exponential model for semiconductor junctions with series and shunt resistances (English)
Microelectronics Reliability 51, No. 12, 2044-2048 (2011).
1
Integration-based approach to evaluate the sub-threshold slope of mosfets (English)
Microelectronics Reliability 50, No. 2, 312-315 (2010).
2
An intelligent tutoring system oriented to the integration of people with intellectual disabilities (English)
PAAMS (Special Sessions and Workshops), 639-647 (2010).
3
LAGUNTXO: A rule-based intelligent tutoring system oriented to people with intellectual disabilities. (English)
Lytras, Miltiadis D. (ed.) et al., Visioning and engineering the knowledge society. A web science perspective. Second world summit on the knowledge society, WSKS 2009, Chania, Crete, Greece, September 16‒18, 2009. Proceedings. Berlin: Springer (ISBN 978-3-642-04753-4/pbk). Lecture Notes in Computer Science 5736. Lecture Notes in Artificial Intelligence, 186-195 (2009).
4
Indirect Fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction (English)
Microelectronics Reliability 49, No. 7, 689-692 (2009).
5
LAGUNTXO: A rule-based intelligent tutoring system oriented to people with intellectual disabilities (English)
WSKS (1), 186-195 (2009).
6
io-port 05301647 Rubio, J.;
Vaquero, C.;
López de Ipiña, J.M.;
Irigoyen, E.;
de Ipiña, K.L.;
Garay, N.;
Conde, A.;
Larrañaga, M.;
Ezeiza, A.;
Soraluze, A.;
Peñagarikano, M.;
Bordel, G.;
Rodríguez, L.J.;
López, J.M.;
Ezquerra, M.;
Oregi, D.
Tutor project: An intelligent tutoring system to improve cognitive disabled people integration. (English)
Miesenberger, Klaus (ed.) et al., Computers helping people with special needs. 11th international conference, ICCHP 2008, Linz, Austria, July 9‒11, 2008. Proceedings. Berlin: Springer (ISBN 978-3-540-70539-0/pbk). Lecture Notes in Computer Science 5105, 729-732 (2008).
7
io-port 70335830 Rubio, Jokin;
Vaquero, C.;
De Ipiña, J. M. López;
Irigoyen, Eloy;
De Ipiña, Karmele López;
Garay, Nestor;
Conde, Angel;
Larrañaga, Mikel;
Ezeiza, Aitzol;
Soraluze, A.;
Peñagarikano, Mikel;
Bordel, Germán;
Rodríguez, Luis Javier;
López, Juan Miguel;
Ezquerra, M.;
Oregi, D.
Tutor project: an intelligent tutoring system to improve cognitive disabled people integration (English)
ICCHP, 729-732 (2008).
8
Portfolio and investment risk analysis on global grids. (English)
J. Comput. Syst. Sci. 73, No. 8, 1164-1175 (2007).
9
Understanding threshold voltage in undoped-body mosfets: an appraisal of various criteria (English)
Microelectronics Reliability 46, No. 5-6, 731-742 (2006).
10
Influence of grid economic factors on scheduling and migration. (English)
Daydé, Michel (ed.) et al., High performance computing for computational science ‒ VECPAR 2004. 6th international conference, Valencia, Spain, June 28‒30, 2004. Revised selected and invited papers. Berlin: Springer (ISBN 3-540-25424-2/pbk). Lecture Notes in Computer Science 3402, 274-287 (2005).
11
Job scheduling and resource management techniques in economic grid environments. (English)
Fernández Rivera, Francisco (ed.) et al., Grid computing. First European across grids conference, Santiago de Compostela, Spain, February 13‒14, 2003. Revised papers. Berlin: Springer (ISBN 3-540-21048-2/pbk). Lecture Notes in Computer Science 2970, 25-32 (2004).
12
Influence of grid economic factors on scheduling and migration (English)
VECPAR, 274-287 (2004).
13
Job scheduling and resource management techniques in economic grid environments (English)
European Across Grids Conference, 25-32 (2003).
14
Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications. (English)
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 21, No. 12, 1497-1502 (2002).
15
Quasi-three-dimensional spice-based simulation of the transient behavior, including plasma spread, of thyristors and over-voltage protectors (English)
Microelectronics Reliability 42, No. 1, 67-76 (2002).
16
A review of recent MOSFET threshold voltage extraction methods (English)
Microelectronics Reliability 42, No. 4-5, 583-596 (2002).
17
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron mosfets (English)
Microelectronics Reliability 42, No. 3, 343-347 (2002).
18
An algebraic problem and the software Maple. (English)
Int. J. Appl. Math. 6, No.2, 129-140 (2001).
19
Determination of trap cross-section in a-si: H p-i-n diodes parameters using simulation and parameter extraction (English)
Microelectronics Reliability 41, No. 4, 605-610 (2001).
20
Result 1 to 20 of 21 total
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