io-port 50232136 Douglas, E. A.;
Chang, C. Y.;
Cheney, D. J.;
Gila, B. P.;
Lo, C. F.;
Lu, Liu;
Holzworth, R.;
Whiting, P.;
Jones, K.;
Via, G. D.;
Kim, Jinhyung;
Jang, Soohwan;
Ren, Fan;
Pearton, S. J.
Algan/gan high electron mobility transistor degradation under on- and off-state stress (English)
Microelectronics Reliability 51, No. 2, 207-211 (2011).
1
Identifying, correcting, and avoiding errors in computer-aided design models which affect interoperability (English)
J. Comput. Inf. Sci. Eng. 1, No. 2, 156-166 (2001).
2
Ligand-receptor 3-D similarity studies using multiple 4-point pharmacophores (English)
Pacific Symposium on Biocomputing, 456-467 (1999).
3
CAD model quality holds key for analysis (English)
IMR, 538-546 (1998).
4
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