io-port.net

io-port 50232638 Liao, Joy Y.; Marks, Howard L.; Beaudoin, F.

OBIRCH analysis of electrically stressed advanced graphic ics (English)

Microelectronics Reliability 47, No. 9-11, 1565-1568 (2007).

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io-port 50233251 Beaudoin, Felix; Sanchez, Kevin; Perdu, Philippe

Dynamic laser stimulation techniques for advanced failure analysis and design debug applications (English)

Microelectronics Reliability 47, No. 9-11, 1517-1522 (2007).

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io-port 50234257 Essely, F.; Darracq, F.; Pouget, Vincent; Remmach, M.; Beaudoin, Felix; Guitard, N.; Bafleur, M.; Perdu, Philippe; Touboul, André; Lewis, Dean

Application of various optical techniques for ESD defect localization (English)

Microelectronics Reliability 46, No. 9-11, 1563-1568 (2006).

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io-port 50232440 Firiti, Abdellatif; Beaudoin, Felix; Haller, G.; Perdu, Philippe; Lewis, Dean; Fouillat, Pascal

Impact of semiconductors material on IR laser stimulation signal (English)

Microelectronics Reliability 45, No. 9-11, 1465-1470 (2005).

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io-port 50232882 Sanchez, Kevin; Desplats, Romain; Beaudoin, Felix; Perdu, Philippe; Roux, J. P.; Woods, G.; Lewis, Dean

NIR laser stimulation for dynamic timing analysis (English)

Microelectronics Reliability 45, No. 9-11, 1459-1464 (2005).

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io-port 50234004 Beaudoin, Felix; Sanchez, Kevin; Desplats, Romain; Perdu, Philippe; Nicot, J. M.; Roux, J. P.; Otte, M.

Dynamic laser stimulation case studies (English)

Microelectronics Reliability 45, No. 9-11, 1538-1543 (2005).

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io-port 50234352 Briand, D.; Beaudoin, Felix; Courbat, J.; De Rooij, N. F.; Desplats, Romain; Perdu, Philippe

Failure analysis of micro-heating elements suspended on thin membranes (English)

Microelectronics Reliability 45, No. 9-11, 1786-1789 (2005).

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io-port 50235177 De Nardi, C.; Desplats, Romain; Perdu, Philippe; Beaudoin, Felix; Gauffier, J. -L.

Oxide charge measurements in EEPROM devices (English)

Microelectronics Reliability 45, No. 9-11, 1514-1519 (2005).

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io-port 50232219 Crépel, O.; Desplats, Romain; Bouttement, Y.; Perdu, Philippe; Goupil, C.; Descamps, Ph.; Beaudoin, Felix; Marina, L.

Magnetic emission mapping for passive integrated components characterisation (English)

Microelectronics Reliability 43, No. 9-11, 1809-1814 (2003).

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io-port 50232521 Beauchêne, T.; Lewis, Dean; Beaudoin, Felix; Pouget, Vincent; Perdu, Philippe; Fouillat, Pascal; Danto, Y.

A physical approach on SCOBIC investigation in VLSI (English)

Microelectronics Reliability 43, No. 1, 173-177 (2003).

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io-port 50233920 Trémouilles, D.; Bertrand, G.; Bafleur, M.; Beaudoin, Felix; Perdu, Philippe; Guitard, N.; Lescouzères, L.

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology (English)

Microelectronics Reliability 43, No. 1, 71-79 (2003).

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io-port 50234003 Lafontan, X.; Pressecq, F.; Beaudoin, Felix; Rigo, S.; Dardalhon, M.; Roux, J. -L.; Schmitt, P.; Kuchenbecker, J.; Baradat, B.; Lellouchi, D.

The advent of MEMS in space (English)

Microelectronics Reliability 43, No. 7, 1061-1083 (2003).

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io-port 50234144 Beaudoin, Felix; Desplats, Romain; Perdu, Philippe; Firiti, Abdellatif; Haller, G.; Pouget, Vincent; Lewis, Dean

From static thermal and photoelectric laser stimulation (TLS/PLS) to dynamic laser testing (English)

Microelectronics Reliability 43, No. 9-11, 1681-1686 (2003).

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io-port 50234273 Sanchez, Kevin; Desplats, Romain; Perez, G.; Pichetto, V.; Beaudoin, Felix; Perdu, Philippe

Solar cell analysis with light emission and OBIC techniques (English)

Microelectronics Reliability 43, No. 9-11, 1755-1760 (2003).

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io-port 50234382 Remmach, M.; Desplats, Romain; Beaudoin, Felix; Frances, E.; Perdu, Philippe; Lewis, Dean

Time resolved photoemission (PICA) - from the physics to practical considerations (English)

Microelectronics Reliability 43, No. 9-11, 1639-1644 (2003).

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io-port 50234637 Firiti, Abdellatif; Faujour, D.; Haller, Gerald; Moragues, J. M.; Goubier, Vincent; Perdu, Philippe; Beaudoin, Felix; Lewis, Dean

Short defect characterization based on TCR parameter extraction (English)

Microelectronics Reliability 43, No. 9-11, 1563-1568 (2003).

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io-port 50235074 Desplats, Romain; Eral, A.; Beaudoin, Felix; Perdu, Philippe; Weger, Alan J.; Mcmanus, Moyra K.; Song, Peilin; Stellari, Franco

Faster IC analysis with PICA spatial temporal photon correlation and CAD autochanneling (English)

Microelectronics Reliability 43, No. 9-11, 1663-1668 (2003).

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io-port 50235172 Beauchêne, T.; Lewis, Dean; Beaudoin, Felix; Pouget, Vincent; Desplats, Romain; Fouillat, Pascal; Perdu, Philippe; Bafleur, M.; Trémouilles, D.

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization (English)

Microelectronics Reliability 43, No. 3, 439-444 (2003).

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io-port 70058700 Desplats, Romain; Beaudoin, Felix; Perdu, Philippe; Nataraj, Nagamani; Lundquist, Ted; Shah, Ketan

Fault localization using time resolved photon emission and STIL waveforms (English)

ITC, 254-263 (2003).

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io-port 50232531 Crépel, O.; Beaudoin, Felix; De Morais, L. Dantas; Haller, G.; Goupil, C.; Perdu, Philippe; Desplats, Romain; Lewis, Dean

Backside hot spot detection using liquid crystal microscopy (English)

Microelectronics Reliability 42, No. 9-11, 1741-1746 (2002).

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