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Result 21 to 28 of 28 total

io-port 70057525 Nigh, Phil

SIA roadmap: test must not limit future technologies (English)

ITC, 1152 (1997).

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io-port 70058013 Nigh, Phil; Forlenza, Donato O.; Motika, Franco

Application and analysis of IDDQ diagnostic software (English)

ITC, 319-327 (1997).

io-port 70058157 Nigh, Phil; Needham, Wayne M.; Butler, Kenneth M.; Maxwell, Peter C.; Aitken, Robert C.; Maly, Wojciech

So what is an optimal test mix? A discussion of the SEMATECH methods experiment (English)

ITC, 1037-1038 (1997).

io-port 70543225 Nigh, Phil; Needham, Wayne M.; Butler, Kenneth M.; Maxwell, Peter C.; Aitken, Robert C.

An experimental study comparing the relative effectiveness of functional, scan, iddq and delay-fault testing (English)

VTS, 459 (1997).

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io-port 70542577 Aitken, Robert C.; Hutcheson, J.; Murthy, N.; Nigh, Phil; Sporck, Nicholas

Volume manufacturing - ics and boards: DFT to the rescue? (English)

VTS, 212-213 (1996).

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io-port 70056072 Wheater, Donald L.; Nigh, Phil; Mechler, Jeanne Trinko; Lacroix, Luke

ASIC test cost/strategy trade-offs (English)

ITC, 93-102 (1994).

io-port 05092975 Nigh, Phil; Maly, Wojciech

Test Generation for Current Testing (CMOS ICs). (English)

IEEE Design and Test of Computers 07, No.01, 26-38 (1990).

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io-port 50354106 Nigh, Phil; Maly, Wojciech

Test generation for current testing (CMOS ics) (English)

IEEE Design & Test of Computers 7, No. 1, 26-38 (1990).

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