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A novel chopping-spinning MAGFET device (English)
ICECS, 815-818 (2010).
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1
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Modelling of hot-carrier degradation and its application for analog design for reliability (English)
Microelectronics Journal 40, No. 9, 1274-1280 (2009).
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2
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Analytical modeling of hot-carrier induced degradation of MOS transistor for analog design for reliability (English)
ISQED, 53-58 (2007).
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Automatic layout generation for CMOS analog transistors (English)
EURO-DAC, 54-58 (1994).
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