A new built-in defect-based testing technique to achieve zero defects in the automotive environment (English)
J. Electronic Testing 27, No. 1, 19-30 (2011).
1
A new built-in screening methodology for successive approximation register analog to digital converters (English)
Microelectronics Reliability 50, No. 9-11, 1750-1757 (2010).
2
Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications (English)
European Test Symposium, 170-174 (2010).
3
A new built-in screening methodology to achieve zero defects in the automotive environment (English)
Microelectronics Reliability 49, No. 9-11, 1334-1340 (2009).
4
Novel solution for the built-in gate oxide stress test of LDMOS in integrated circuits for automotive applications (English)
European Test Symposium, 67-72 (2009).
5
Start
Contact
Print
General Help
