History
1
an:50233908
1


Please fill in your query. A complete syntax description you will find on the General Help page.
A 5000 h RF life test on 330 W RF-LDMOS transistors for radars applications (English)
Microelectronics Reliability 50, No. 9-11, 1574-1576 (2010).
WorldCat.org
PDF XML AMS-TeX TEXT BIBTeX DOI
Valid XHTML 1.0 Transitional Valid CSS!