io-port 50233822 Khong, B.;
Tounsi, P.;
Dupuy, Ph.;
Chauffleur, X.;
Legros, M.;
Deram, A.;
Levade, C.;
Vanderschaeve, G.;
Dorkel, J. M.;
Fradin, J. P.
Innovative methodology for predictive reliability of intelligent power devices using extreme electro-thermal fatigue (English)
Microelectronics Reliability 45, No. 9-11, 1717-1722 (2005).
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