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io-port 50037070
Sheldon, Frederick T.
;
Kavi, Krishna M.
;
Tausworthe, Robert
;
Yu, James T.
;
Brettschneider, Ralph
;
Everett, William W.
Reliability measurement: from theory to practice
(English)
IEEE Software 9, No. 4, 13-20 (1992).
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