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A high-fault-coverage approach for the test of data, control and handshake interconnects in mesh networks-on-chip. (English)
IEEE Trans. Comput. 57, No. 09, 1202-1215 (2008).
Summary: A novel strategy to detect interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control and communication handshake lines are considered in a cost-effective test sequence for Mesh NoC topologies based on XY routing.
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