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io-port 05333709
Kim, Bruce C.
TTTC newsletter.
(English)
IEEE Design and Test of Computers 25, No. 01, 103 (2008).
Summary: This newsletter provides information on past and upcoming events related to the IEEE Computer Society’s Test Technology Technical Council and the test community.
Keywords:
TTTC
;
test technology
;
DATE
;
DDECS
;
VTS
;
WTW
;
ETS
;
SDD
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