Result 1 to 20 of 24 total
Test data compression for noc based SoCs using binary arithmetic operations. (English)
Rahaman, Hafizur (ed.) et al., Progress in VLSI design and test. 16th international symposium, VDAT 2012, Shibpur, India, July 1‒4, 2012. Proceedings. Berlin: Springer (ISBN 978-3-642-31493-3/pbk). Lecture Notes in Computer Science 7373, 337-342 (2012).
1
A modified scheme for simultaneous reduction of test data volume and testing power. (English)
Rahaman, Hafizur (ed.) et al., Progress in VLSI design and test. 16th international symposium, VDAT 2012, Shibpur, India, July 1‒4, 2012. Proceedings. Berlin: Springer (ISBN 978-3-642-31493-3/pbk). Lecture Notes in Computer Science 7373, 198-208 (2012).
2
Test data compression using alternating variable run-length code. (English)
Integr., VLSI J. 44, No. 2, 103-110 (2011).
3
A scheme of test data compression based on coding of even bits marking and selective output inversion. (English)
Comput. Electr. Eng. 36, No. 5, 969-977 (2010).
4
Align-encode delay assignment in the case of XOR-decompressors: impact of parallel computations. (English)
J. Interconnect. Netw. 10, No. 4, 261-281 (2009).
5
Scan cell positioning for boosting the compression of fan-out networks. (English)
J. Comput. Sci. Technol. 24, No. 5, 939-948 (2009).
6
Application of group and expansion code in test data compression. (Chinese)
J. Comput. Appl. 28, No. 10, 2701-2703 (2008).
7
X-block: An efficient LFSR reseeding-based method to block unknowns for temporal compactors. (English)
IEEE Trans. Comput. 57, No. 07, 978-989 (2008).
8
A selective trigger scan architecture for VLSI testing. (English)
IEEE Trans. Comput. 57, No. 03, 316-328 (2008).
9
Historical perspective on scan compression. (English)
IEEE Design and Test of Computers 25, No. 02, 114-120 (2008).
10
Guest editors’ introduction: Progress in test compression. (English)
IEEE Design and Test of Computers 25, No. 02, 112-113 (2008).
11
Low cost scan test by test correlation utilization. (English)
J. Comput. Sci. Technol. 22, No. 5, 681-694 (2007).
12
Optimal selective huffman coding for test-data compression. (English)
IEEE Trans. Comput. 56, No. 08, 1146-1152 (2007).
13
Data-independent pattern run-length compression for testing embedded cores in socs. (English)
IEEE Trans. Comput. 56, No. 04, 545-556 (2007).
14
On test data compression using selective don’t-care identification. (English)
J. Comput. Sci. Technol. 20, No. 2, 210-215 (2005).
15
Statistical tests of optimality of source codes. (English)
Kybernetika 31, No.4, 321-330 (1995).
16
A Concurrent Test Architecture for Massively Parallel Computers and Its Error Detection Capability. (English)
IEEE Transactions on Parallel and Distributed Systems 05, No.11, 1169-1184 (1994).
17
Group Theoretic Signature Analysis. (English)
IEEE Transactions on Computers 39, No.11, 1398-1403 (1990).
18
Optimal Robust Compression of Test Responses. (English)
IEEE Transactions on Computers 39, No.01, 138-141 (1990).
19
Effectiveness of multiple compressions of multiple signatures. (English)
Int. J. Electron. 66, No.5, 775-787 (1989).
20
Result 1 to 20 of 24 total
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