@article {IOPORT.50234029,
    author       = {Lachenal, D. and Bravaix, A. and Monsieur, F. and Rey-Tauriac, Yannick},
    title        = {Degradation mechanism understanding of NLDEMOS SOI in RF applications},
    year         = {2007},
    journal      = {Microelectronics Reliability},
    volume       = {47},
    number       = {9-11},
    pages        = {1634-1638},
    doi          = {10.1016/j.microrel.2007.07.024},
    identifier   = {50234029},
}