50233288

j

50233288 Alam, Muhammad Ashraful Kufluoglu, Haldun Varghese, D. Mahapatra, S. A comprehensive model for PMOS NBTI degradation: recent progress Microelectronics Reliability 47, No. 6, 853-862 (2007). 2007 EN

doi:10.1016/j.microrel.2006.10.012