History


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Result 1 to 5 of 5 total

Full-chip analysis of unintentional forward biased diodes (English)
ISQED, 62-66 (2011).
WorldCat.org
1
Pessimism reduction in crosstalk noise aware STA (English)
ICCAD, 954-961 (2005).
WorldCat.org
2
A methodology for chip-level electromigration risk assessment and product qualification (English)
ISQED, 232-237 (2004).
WorldCat.org
3
Noise propagation and failure criteria for VLSI designs (English)
ICCAD, 587-594 (2002).
WorldCat.org
4
Clarinet: a noise analysis tool for deep submicron design (English)
DAC, 233-238 (2000).
WorldCat.org
5
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Result 1 to 5 of 5 total

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